1. Design, manufacture and testing of multilayer mirrors for X-ray and VUV spectral bands with the wavelengths of 0.01 nm to 100 nm.
  2. Creation of multi mirror x-ray systems with a high spatial resolution for microscopy and microanalysis. X-ray microscopy in the field of "carbon window".
  3. Development of methods to calculate and simulate the propagation of coherent and incoherent waves, taking into account the X-ray band singularities.
  4. X-ray computer micro tomography.
  5. Creation and use of diffraction X-ray optics based on the sliced (edge) multilayer structures.